LiteScope is a unique Scanning Probe Microscope (SPM). It is specifically designed to be integrated into SEM microscopes on a "Plug & Play" basis. It can be simply attached to the sample stage of the electron microscope of different manufacturers
NenoVision has developed unique technology - Correlative Probe and Electron Microscopy (CPEM) - for application in correlative imaging. CPEM enables the determination of the surface characterization of a sample area by both SEM and SPM simultaneously and using the same co-ordination system.